NOMATEN Webinar on DEC 1 at 1PM: Scanning electron microscopy and related techniques in application to materials characterization
Join our webinar via GoToMeeting: https://www.gotomeet.me/NCBJmeetings/nomaten-seminar
DECEMBER 1st 2020 at 01:00-02:30PM (UTC+1)
ABSTRACT: Scanning electron microscopy and related techniques in application to materials characterization
The Scanning Electron Microscopy (SEM) supported with the Energy-Dispersive X-Ray Spectrometry (EDS) and Electron Backscatter Diffraction(EBSD) is considered as a common technique in characterization of structural properties and composition of materials. When combined with Focused Ion Beam (FIB) technology may be used for FIB-TEM sample preparation, patterning of complex structures and sectioning for high-resolution imaging.
The lecture aims to present the possibilities offered by the use of the scanning electron microscopy and related techniques in the field of material research. For this purpose, the theoretical basis of SEM imaging will be briefly discussed and followed by a number of application examples of SEM, EDS EBSD and FIB obtained during the studies of various materials. Special attention will be focused on the application of low-kV SEM.
BIO NOTE
Iwona JÓŹWIK is a specialist in scanning electron microscopy (SEM) and related techniques, i.e. EDS, EBSD, CL, and also a specialist in sample preparation using focused ion beam (FIB) techniques. She obtained her master degree in Physics at the Faculty of Mathematics and Physics of the University of Maria Curie-Skłodowska in Lublin, Poland (2001) and her PhD degree in Physics in 2006 by the decision of the Council of the Faculty of Applied Physics and Mathematics of the Gdańsk University of Technology, Gdańsk, Poland.
Since 2008, she has been employed at the Institute of Electronic Materials Technology in Warsaw, and since 2017 also at the National Center for Nuclear Research, where she conducts research in the field of structural characterization of materials. Currently her research focuses on the application of low-energy scanning electron microscopy to direct visualization of the damage in semiconductors subjected to ion bombardment. She has published more than 60 scientific papers in the international journals with indexed IF. Her H-index is 11 (Web of Science) with more than 300 citations.
